Mapping the elastic properties of granular Au films by contact resonance atomic force microscopy.

@article{Stan2008MappingTE,
  title={Mapping the elastic properties of granular Au films by contact resonance atomic force microscopy.},
  author={Gheorghe Stan and Robert F. Cook},
  journal={Nanotechnology},
  year={2008},
  volume={19 23},
  pages={235701}
}
Endowed with nanoscale spatial resolution, contact resonance atomic force microscopy (CR-AFM) provides extremely localized elastic property measurements. We advance here the applicability of CR-AFM on surfaces with nanosize features by considering the topography contribution to the CR-AFM signal. On nanosize granular Au films, the elastic modulus at the grain scale has been mapped out by considering a self-consistent deconvolution of the contact geometry effect in the CR-AFM image. Significant… CONTINUE READING