Main Magnetic Focus Ion Source: I. Basic principles and theoretical predictions
@article{Ovsyannikov2015MainMF, title={Main Magnetic Focus Ion Source: I. Basic principles and theoretical predictions}, author={Valeriy Petrovich Ovsyannikov and Andrei V. Nefiodov}, journal={arXiv: Plasma Physics}, year={2015} }
It is proposed to produce highly charged ions in the local potential traps formed by the rippled electron beam in a focusing magnetic field. In this method, the extremely high electron current densities can be attained on short length of the ion trap. The design the very compact ion sources is feasible. For such ions as, for example, Ne${}^{8+}$ and Xe${}^{44+}$, the intensities of about $10^9$ and $10^6$ particles per second, respectively, can be obtained.
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Main Magnetic Focus Ion Source: II. The first investigations at 10 keV
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- 2015
The basic principles of design for the compact ion source of new generation are presented. The device uses the local ion trap created by the axial electron beam rippled in a thick magnetic lens. In…
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