Low overhead test point insertion for scan-based BIST

@inproceedings{Nakao1999LowOT,
  title={Low overhead test point insertion for scan-based BIST},
  author={Michinobu Nakao and Seiji Kobayashi and Kazumi Hatayama and Kazuhiko Iijima and Seiji Terada},
  booktitle={ITC},
  year={1999}
}
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