Low latency demodulation for Atomic Force Microscopes, Part I efficient real-time integration

@article{Abramovitch2011LowLD,
  title={Low latency demodulation for Atomic Force Microscopes, Part I efficient real-time integration},
  author={Daniel Y. Abramovitch},
  journal={Proceedings of the 2011 American Control Conference},
  year={2011},
  pages={2252-2257}
}
This paper describes methods for doing high speed, low latency, coherent demodulation of signals for dynamic or AC mode in Atomic Force Microscopes (AFMs) [1]. These demodulation methods allow the system to extract signal information in as little as one cycle of the fundamental oscillation frequency. By having so little latency, the demodulator minimizes the time delay in the servo loop for an AC mode AFM. This in turn minimizes the negative phase effects of the demodulation allowing for higher… CONTINUE READING

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References

Publications referenced by this paper.
SHOWING 1-10 OF 15 REFERENCES

Coherent demodulation with reduced latency adapted for use in scanning probe microscopes,

  • D. Y. Abramovitch
  • United States Patent 7,843,627,
  • 2010
1 Excerpt

and A

  • R. W. Stark, G. Schitter
  • Stemmer, “Tuning the interaction forces in…
  • 2003
1 Excerpt

Char - acterization and optimization of scan speed for tapping mode atomic force microscopy

  • G. Schitter Stark, A. Stemmer
  • Rev . Sci . Instrum .
  • 2002

and C

  • T. Sulchek, G. G. Yaralioglu, S. C. Minne
  • F. Quate, “Characterization and optimization of…
  • 2002
1 Excerpt

and V

  • B. Anczykowski, B. Gotsmann, H. Fuchs, J. P. Cleveland
  • B. Elings, “How to measure energy dissipation in…
  • 1999
1 Excerpt

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