Low frequency noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors

@article{Ioannidis2011LowFN,
  title={Low frequency noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors},
  author={Eleftherios G. Ioannidis and S{\'e}bastien Haendler and A. Bajolet and T. Pahron and Nicolas Planes and Franck Arnaud and R. A. Bianchi and Michel Haond and Dariusz Golański and Julien Rosa and Claire Fenouillet-B{\'e}ranger and P. Perreau and C. A. Dimitriadis and G{\'e}rard Ghibaudo},
  journal={2011 International Electron Devices Meeting},
  year={2011},
  pages={18.6.1-18.6.4}
}
In this paper, we present, for the first time, a thorough investigation of low frequency noise (LFN) and statistical noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors. The experimental results are well interpreted by Monte-Carlo LFN simulations based on the random spatial and energy distribution of discrete traps in the gate dielectric. Our results clearly indicate that the LFN variability of 28nm FD-SOI CMOS technology is improved as compared to previous 45nm… CONTINUE READING

Figures from this paper.

Citations

Publications citing this paper.
SHOWING 1-10 OF 22 CITATIONS

RTN and LFN Noise Performance in Advanced FDSOI Technology

  • 2018 48th European Solid-State Device Research Conference (ESSDERC)
  • 2018
VIEW 8 EXCERPTS
CITES BACKGROUND
HIGHLY INFLUENCED

Noise-induced dynamic variability in nano-scale CMOS SRAM cells

  • 2016 46th European Solid-State Device Research Conference (ESSDERC)
  • 2016
VIEW 6 EXCERPTS
CITES BACKGROUND

Statistical low-frequency noise characterization in sub-15 nm Si/SiGe nanowire Trigate pMOSFETs

  • 2017 International Conference of Microelectronic Test Structures (ICMTS)
  • 2017
VIEW 1 EXCERPT
CITES BACKGROUND

References

Publications referenced by this paper.
SHOWING 1-3 OF 3 REFERENCES

et al

G. Ghibaudo
  • Phys. Stat. Sol. A. vol. 132, pp. 501-507
  • 1992
VIEW 1 EXCERPT

et al

K. K Hung
  • IEEE Trans. Electron. Dev.37, pp.654
  • 1990