Low cost ultra-pure sine wave generation with self calibration

  title={Low cost ultra-pure sine wave generation with self calibration},
  author={Yuming Zhuang and Akhilesh Kesavan Unnithan and Arun Joseph and Siva Sudani and Benjamin Magstadt and Degang Chen},
  journal={2016 IEEE International Test Conference (ITC)},
As data acquisition systems' performance continues to increase, so does the need for a test and characterization solution to have an input test signal with purity that exceeds what is currently available in state of the art instruments. This paper presents a new method for generating ultra-pure sine wave that can be used in such applications. The pure sine wave is generated by readily available DACs with distortions that could be thousands time worse than the required system purity. Readily… CONTINUE READING
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