Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology

@inproceedings{Qi2015LowCA,
  title={Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology},
  author={Chunhua Qi and Liyi Xiao and Jing Guo and Tianqi Wang},
  year={2015}
}
  • Chunhua Qi, Liyi Xiao, +1 author Tianqi Wang
  • Published 2015

From This Paper

Figures, tables, results, connections, and topics extracted from this paper.
4 Extracted Citations
31 Extracted References
Similar Papers

Referenced Papers

Publications referenced by this paper.
Showing 1-10 of 31 references

Similar Papers

Loading similar papers…