Low-capture-power test generation for scan-based at-speed testing

  title={Low-capture-power test generation for scan-based at-speed testing},
  author={Xiaoqing Wen and Yoshiyuki Yamashita and Shohei Morishima and Seiji Kajihara and Laung-Terng Wang and Kewal K. Saluja and Kozo Kinoshita},
  journal={IEEE International Conference on Test, 2005.},
  pages={10 pp.-1028}
Scan-based at-speed testing is a key technology to guarantee timing-related test quality in the deep submicron era. However, its applicability is being severely challenged since significant yield loss may occur from circuit malfunction due to excessive IR drop caused by high power dissipation when a test response is captured. This paper addresses this critical problem with a novel low-capture-power X-filling method of assigning 0's and 1's to unspecified (X) bits in a test cube obtained during… CONTINUE READING
Highly Influential
This paper has highly influenced 12 other papers. REVIEW HIGHLY INFLUENTIAL CITATIONS
Highly Cited
This paper has 155 citations. REVIEW CITATIONS
104 Extracted Citations
27 Extracted References
Similar Papers

Citing Papers

Publications influenced by this paper.
Showing 1-10 of 104 extracted citations

156 Citations

Citations per Year
Semantic Scholar estimates that this publication has 156 citations based on the available data.

See our FAQ for additional information.

Referenced Papers

Publications referenced by this paper.
Showing 1-10 of 27 references

Similar Papers

Loading similar papers…