Low-capture-power test generation for scan-based at-speed testing

@article{Wen2005LowcapturepowerTG,
  title={Low-capture-power test generation for scan-based at-speed testing},
  author={Xiaoqing Wen and Yoshiyuki Yamashita and Shohei Morishima and Seiji Kajihara and Laung-Terng Wang and Kewal K. Saluja and Kozo Kinoshita},
  journal={IEEE International Conference on Test, 2005.},
  year={2005},
  pages={10 pp.-1028}
}
Scan-based at-speed testing is a key technology to guarantee timing-related test quality in the deep submicron era. However, its applicability is being severely challenged since significant yield loss may occur from circuit malfunction due to excessive IR drop caused by high power dissipation when a test response is captured. This paper addresses this critical problem with a novel low-capture-power X-filling method of assigning 0's and 1's to unspecified (X) bits in a test cube obtained during… CONTINUE READING
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