Low-Power Test Data Application in EDT Environment Through Decompressor Freeze

@article{Czysz2008LowPowerTD,
  title={Low-Power Test Data Application in EDT Environment Through Decompressor Freeze},
  author={Dariusz Czysz and Grzegorz Mrugalski and Janusz Rajski and Jerzy Tyszer},
  journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
  year={2008},
  volume={27},
  pages={1278-1290}
}
This paper presents a new low-power test scheme integrated with the embedded deterministic test environment. The key contribution of this paper is a flexible test cube encoding scheme, which, in conjunction with a continuous flow decompressor, allows one to significantly reduce toggling rates when test patterns are fed into scan chains. The proposed solution requires neither additional design for testability logic nor modifications to the circuit under test. Experimental results obtained for… CONTINUE READING
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Low power scan test application in test compression environment

  • X. Lin, D. Czysz, M. Kassab, G. Mrugalski, J. Rajski, J. Tyszer
  • 2007. US patent application.
  • 2007
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