Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding

@inproceedings{Rosinger2002LowPM,
  title={Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding},
  author={Paul M. Rosinger and Bashir M. Al-Hashimi and Nicola Nicolici},
  booktitle={ICCD},
  year={2002}
}
Low power designtechniqueshavebeenemployedfor more than two decades,however an emerging problemis satisfyingthe testpowerconstraints for avoidingdestructive testand improving the yield. Our resear ch addresses this problemby proposinga new methodwhich maintains the benefitsof mixed-modebuilt-in self-test(BIST) (low testapplicationtimeandhigh fault coverage),andreduces theexcessivepowerdissipationassociatedwith scan-based test. This is achievedby employingdual linear feedback shift register… CONTINUE READING
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