Low-Phase Noise Clock Distribution Network Using Rotary Traveling-Wave Oscillators and Built-In Self-Test Phase Tuning Technique

Abstract

This brief describes a built-in self-test (BIST) technique used to verify and tune the timing integrity of a clock distribution system implemented with injection-locked rotary traveling-wave oscillators (RTWOs). The die is fabricated in a 130-nm CMOS process and occupies 4.4 mm × 2.25 mm and is limited by the outer diameter of the RTWOs, leaving… (More)
DOI: 10.1109/TCSII.2014.2362743

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