Time-Based All-Digital Technique for Analog Built-in Self-Test
A low cost method for testing analog RF signal paths suitable for BIST implementation in a SoC environment is described. The method is based on the use of a simple and low-cost one-bit digitizer that enables the reuse of processor and memory resources available in the SoC, while incurring little analog area overhead. The proposed method also allows a constant load to be observed by the circuit, since no switches or muxes are needed for digitizing specific test points. Mathematical background and experimental results are presented in order to validate the test approach.