Logic soft errors: a major barrier to robust platform design

  title={Logic soft errors: a major barrier to robust platform design},
  author={Subhasish Mitra and Ming Zhang and T. M. Mak and Norbert Seifert and Victor Zia and Kee Sup Kim},
  journal={IEEE International Conference on Test, 2005.},
  pages={10 pp.-696}
Radiation induced soft errors in flip-flops, latches and combinational logic circuits, also called logic soft errors, pose a major challenge in the design of robust platforms for enterprise computing and networking applications. Associated power and performance overheads are major barriers to the adoption of classical fault-tolerance techniques to protect such systems from soft errors. Design-for-functional-test and debug resources can be reused for built-in soft error resilience during normal… CONTINUE READING
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