Logic soft errors: a major barrier to robust platform design

@article{Mitra2005LogicSE,
  title={Logic soft errors: a major barrier to robust platform design},
  author={Subhasish Mitra and Ming Zhang and T. M. Mak and Norbert Seifert and Victor Zia and Kee Sup Kim},
  journal={IEEE International Conference on Test, 2005.},
  year={2005},
  pages={10 pp.-696}
}
Radiation induced soft errors in flip-flops, latches and combinational logic circuits, also called logic soft errors, pose a major challenge in the design of robust platforms for enterprise computing and networking applications. Associated power and performance overheads are major barriers to the adoption of classical fault-tolerance techniques to protect such systems from soft errors. Design-for-functional-test and debug resources can be reused for built-in soft error resilience during normal… CONTINUE READING
Highly Cited
This paper has 55 citations. REVIEW CITATIONS

Citations

Publications citing this paper.
Showing 1-10 of 38 extracted citations

A new method for correcting time and soft errors in combinational circuits

2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) • 2013
View 4 Excerpts
Highly Influenced

SEU-Hardened Dual Data Rate Flip-Flop Using C-Elements

2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems • 2010
View 6 Excerpts
Highly Influenced

CSER: BISER-based concurrent soft-error resilience

2010 28th VLSI Test Symposium (VTS) • 2010
View 7 Excerpts
Highly Influenced

Soft-error hardened redundant triggered latch

2012 4th Asia Symposium on Quality Electronic Design (ASQED) • 2012
View 1 Excerpt

Tracking On-Chip Age Using Distributed, Embedded Sensors

IEEE Transactions on Very Large Scale Integration (VLSI) Systems • 2012
View 2 Excerpts

56 Citations

01020'08'11'14'17
Citations per Year
Semantic Scholar estimates that this publication has 56 citations based on the available data.

See our FAQ for additional information.

References

Publications referenced by this paper.
Showing 1-10 of 19 references

Bartky, “A Theory of Asynchronous Circuits

D. Muller
Proc. Intl. Symp. Theory of Switching, • 1959
View 2 Excerpts
Highly Influenced

SRAM SER in 90, 130 and 180 nm bulk and SOI technologies

2004 IEEE International Reliability Physics Symposium. Proceedings • 2004

Timing vulnerability factors of sequentials

IEEE Transactions on Device and Materials Reliability • 2004

A Systematic Approach to SER Estimation and Solutions

H. T. Nguyen, Y. Yagil
Proc. Intl. Reliability Physics Symp., pp • 2003

Similar Papers

Loading similar papers…