Logic design techniques for 65 to 45nm and below for reducing total energy and solving technology variations problems

Abstract

In sub-100 nm technologies, leakage related problems are based on the standby current's exponential dependency on both, parameter scaling and parameter variation. Countermeasures, reducing the standby current and its spread can be classified into 3 categories: First, improved devices can reduce leakage sources by orders of magnitude, requiring completely… (More)
DOI: 10.1109/ICECS.2007.4511141

Topics

4 Figures and Tables

Slides referencing similar topics