Logic BIST with scan chain segmentation

@article{Lai2004LogicBW,
  title={Logic BIST with scan chain segmentation},
  author={Liyang Lai and Janak H. Patel and Thomas Rinderknecht and Wu-Tung Cheng},
  journal={2004 International Conferce on Test},
  year={2004},
  pages={57-66}
}
This work presents a novel BIST (built-in self test) scheme with scan chain segmentation. In the scheme, a combination of pseudo random patterns and single-weight patterns have been applied to CUT (circuit under test). Scan chain is partitioned into multiple segments delimited by inverters. When a single weighted pattern is applied to a segmented scan chain, successive segments receive bit patterns with complementary weights. Several segment configurations may be required to achieve full fault… CONTINUE READING
Highly Cited
This paper has 27 citations. REVIEW CITATIONS
15 Citations
32 References
Similar Papers

Citations

Publications citing this paper.
Showing 1-10 of 15 extracted citations

References

Publications referenced by this paper.

Similar Papers

Loading similar papers…