Localized excited charge carriers generate ultrafast inhomogeneous strain in the multiferroic BiFeO3.


We apply ultrafast x-ray diffraction with femtosecond temporal resolution to monitor the lattice dynamics in a thin film of multiferroic BiFeO3 after above-band-gap photoexcitation. The sound-velocity limited evolution of the observed lattice strains indicates a quasi-instantaneous photoinduced stress which decays on a nanosecond time scale. This stress… (More)

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Citations per Year

Citation Velocity: 9

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