Localization factor: a new parameter for the quantitative characterization of surface structure with atomic force microscopy (AFM).

Abstract

In this work we present the possible application of a new parameter called localization factor for the quantitative characterization of surface structures with atomic force microscopy (AFM). For this purpose contact mode AFM images were taken from technologically different polycrystalline gold thin films and were evaluated according to the following… (More)
DOI: 10.1016/j.micron.2011.09.005

9 Figures and Tables

Topics

  • Presentations referencing similar topics