Local indentation modulus characterization via two contact resonance frequencies atomic force acoustic microscopy

@inproceedings{Passeri2006LocalIM,
  title={Local indentation modulus characterization via two contact resonance frequencies atomic force acoustic microscopy},
  author={Daniele Passeri and Andrea Bettucci and Massimo Germano and Matteo Rossi and Adriano Alippi and Alexandre Fiori and Emanuela Tamburri and Silvia Orlanducci and Maria Letizia Terranova and Joost J. Vlassak},
  year={2006}
}
Atomic force acoustic microscopy is a dynamical AFM-based technique developed for non-destructive characterization of elastic properties of materials at micrometrical and sub-micrometrical scale. A standard AFM apparatus is equipped with a piezoelectric transducer exciting longitudinal oscillations at ultrasonic frequencies in the sample under investigation. Tip–sample contact stiffness is obtained through the values of the measured resonance frequencies of the cantilever contacting the sample… CONTINUE READING

References

Publications referenced by this paper.
Showing 1-10 of 10 references

Jpn

  • O. Kolosov, K. Yamanaka
  • J. Appl. Phys., Part 2 32
  • 1993
Highly Influential
2 Excerpts

Appl

  • D. Passeri, A. Bettucci, +6 authors M. L. Terranova
  • Phys. Lett. 88
  • 2006

Phys

  • J. S. Blakemore, J. Appl
  • 53 (1982) R123. .
  • 2006

J

  • M. Kopycinska-Müller, R. H. Geiss
  • Müller, D.C. Hurley, Nanotechnology 16
  • 2005
1 Excerpt

Meas

  • D. C. Hurley, M. Kopycinska-Müller, A. B. Kos, R. H. Geiss
  • Sci. Technol. 16
  • 2005
1 Excerpt

Chem

  • E. Kester, U. Rabe, L. Presmanes, P. Tailhades, W. Arnold, J. Phys
  • Solids 61
  • 2000
3 Excerpts

W

  • U. Rabe, S. Amelio, E. Kester, V. Scherer, S. Hirsekorn
  • Arnold, Ultrasonics 38
  • 2000

Rev

  • J. E. Sader, J.W.M. Chon, P. Mulvaney
  • Sci. Instrum. 70
  • 1999

Surf

  • U. Rabe, E. Kester, W. Arnold
  • Interface Anal. 27
  • 1999

V

  • A. L. Weisenhorn, M. Khorsandi, S. Kasas
  • Gotzos, H.J. Butt, Nanotechnology 4
  • 1993
1 Excerpt

Similar Papers

Loading similar papers…