Linked faults in random access memories: concept, fault models, test algorithms, and industrial results

  title={Linked faults in random access memories: concept, fault models, test algorithms, and industrial results},
  author={Said Hamdioui and Zaid Al-Ars and Ad J. van de Goor and Mike Rodgers},
  journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
The analysis of linked faults (LFs), which are faults that influence the behavior of each other, such that masking can occur, has proven to be a source for new memory tests, characterized by an increased fault coverage. However, many newly reported fault models have not been investigated from the point-of-view of LFs. This paper presents a complete analysis of LFs, based on the concept of fault primitives, such that the whole space of LFs is investigated and accounted for and validated. Some… CONTINUE READING
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