Linear systems formulation of image analysis in the presence of both aberrations and surface scatter

@inproceedings{Choi2011LinearSF,
  title={Linear systems formulation of image analysis in the presence of both aberrations and surface scatter},
  author={Narak Choi and J. E. Harvey},
  booktitle={Optical Engineering + Applications},
  year={2011}
}
Image analysis in the presence of surface scatter due to residual optical fabrication errors is often perceived to be complicated, non-intuitive and computationally intensive. The linear systems formulation of surface scatter phenomena has resulted in the development of an angle spread function that is completely analogous to the point spread function in modern image formation theory; i.e., surface scatter can be treated very similar to conventional wavefront aberrations. For multi-element… Expand
Measurement and modelling of the directional scattering of light.

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