Line-focused laser ablation for depth-profiling analysis of coated and layered materials.

@article{Mateo2003LinefocusedLA,
  title={Line-focused laser ablation for depth-profiling analysis of coated and layered materials.},
  author={Mar{\'i}a Jos{\'e} Pueyo Mateo and Luisa Mar{\'i}a Cabal{\'i}n and J. Javier Laserna},
  journal={Applied optics},
  year={2003},
  volume={42 30},
  pages={
          6057-62
        }
}
The performance features of line-focused laser ablation for the characterization of interfaces in layered materials by laser-induced plasma spectrometry (LIPS) have been compared with the point-focusing method in terms of signal precision, signal-to-noise ratio, ablation rates, and surface sensitivity. In both optical configurations a pulsed Nd:YAG laser beam operating at 532 nm, with a homogeneous energy distribution (flattop laser), is used to generate point and microline plasmas on the… CONTINUE READING

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