Leveraging CMOS Aging for Efficient Microelectronics Design

  title={Leveraging CMOS Aging for Efficient Microelectronics Design},
  author={Antonio Leonel Hern{\'a}ndez Mart{\'i}nez and S. Khursheed and Daniele Rossi},
  journal={2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)},
Aging is known to impact electronic systems affecting performance and reliability. However, it has been shown that it also brings benefits for power saving and area optimization. This paper presents highlights of those benefits and further shows how aging effects can be leveraged by novel methods to contribute towards improving hardware oriented security and reliability of electronic circuits. We have demonstrated static power reduction in complex circuits from IWLS05 benchmark suite, reaching… Expand

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