Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques

  title={Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques},
  author={Yu Wang and Xiaoming Chen and Wenping Wang and Yu Cao and Yuan Xie and Huazhong Yang},
  journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
As technology scales, the aging effect caused by negative bias temperature instability (NBTI) has become a major reliability concern. In the mean time, reducing leakage power remains to be one of the key design goals. Because both NBTI-induced circuit degradation and standby leakage power have a strong dependency on the input vectors, input vector control (IVC) technique could be adopted to reduce the leakage power and mitigate NBTI-induced degradation. The IVC technique, however, is… CONTINUE READING
Highly Cited
This paper has 55 citations. REVIEW CITATIONS


Publications citing this paper.
Showing 1-10 of 36 extracted citations

55 Citations

Citations per Year
Semantic Scholar estimates that this publication has 55 citations based on the available data.

See our FAQ for additional information.


Publications referenced by this paper.
Showing 1-10 of 46 references

Similar Papers

Loading similar papers…