Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques

@article{Wang2011LeakagePA,
  title={Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques},
  author={Yu Wang and Xiaoming Chen and Wenping Wang and Yu Cao and Yuan Xie and Huazhong Yang},
  journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
  year={2011},
  volume={19},
  pages={615-628}
}
As technology scales, the aging effect caused by negative bias temperature instability (NBTI) has become a major reliability concern. In the mean time, reducing leakage power remains to be one of the key design goals. Because both NBTI-induced circuit degradation and standby leakage power have a strong dependency on the input vectors, input vector control (IVC) technique could be adopted to reduce the leakage power and mitigate NBTI-induced degradation. The IVC technique, however, is… CONTINUE READING
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