LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects

@article{Sekar2003LIBISTAL,
  title={LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects},
  author={Krishna Sekar and Sujit Dey},
  journal={J. Electronic Testing},
  year={2003},
  volume={19},
  pages={113-123}
}

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