Kelvin probe microscopy of localized electric potentials induced in insulating materials by electron irradiation.

@article{StevensKalceff2004KelvinPM,
  title={Kelvin probe microscopy of localized electric potentials induced in insulating materials by electron irradiation.},
  author={Marion A. Stevens-Kalceff},
  journal={Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada},
  year={2004},
  volume={10 6},
  pages={797-803}
}
Kelvin probe microscopy (KPM) is a specialized atomic force microscopy technique in which long-range Coulomb forces between a conductive atomic force probe and a specimen enable the electrical potential at the surface of a specimen to be characterized with high spatial resolution. KPM has been used to characterize nonconductive materials following their… CONTINUE READING