Jump Simulation: A Technique for Fast and Precise Scan Chain Fault Diagnosis

@article{Kao2006JumpSA,
  title={Jump Simulation: A Technique for Fast and Precise Scan Chain Fault Diagnosis},
  author={Yu-Long Kao and Wei-Shun Chuang and Chien-Mo James Li},
  journal={2006 IEEE International Test Conference},
  year={2006},
  pages={1-9}
}
A diagnosis technique is presented to locate seven types of single faults in scan chains, including stuck-at faults and timing faults. This technique implements the Jump Simulation, a novel parallel simulation technique, to quickly search for the upper and lower bounds of the fault. Regardless of the scan chain length, Jump Simulation packs multiple simulations into one so the simulation time is short. In addition, Jump Simulation tightens the bounds by observing the primary outputs and scan… CONTINUE READING
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