Ion distributions at charged aqueous surfaces by near-resonance X-ray spectroscopy.

Abstract

Near-resonance X-ray spectroscopy is used to determine ion distributions and their local environment at charged aqueous interfaces. Energy scans at fixed momentum-transfers under specular reflectivity conditions near the L(III) Cs(+) resonance reveal the formation of a diffuse Gouy-Chapman layer at a charged surface formed by a Langmuir monolayer… (More)

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