Corpus ID: 14894721

Investigations of Zinc (Zn) Whiskers using FIB Technology

@inproceedings{Reynolds2004InvestigationsOZ,
  title={Investigations of Zinc (Zn) Whiskers using FIB Technology},
  author={H. Reynolds and R. Hilty},
  year={2004}
}
Mitigation of tin whiskers on tin plated components is a critical issue that must be addressed by the electronics industry prior to the implementation of lead-free processing. The study of whisker formation and growth in alternative material systems may provide insight into mechanisms for whisker behavior in tin systems. This work focuses on the characterization of zinc whiskers grown from an electroplated zinc layer over carbon steel. Focused ion beam (FIB) technology and traditional… Expand

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