Investigation on nonlinear distortion of acoustic devices for radio-frequency applications and its supression

@article{Ueda2009InvestigationON,
  title={Investigation on nonlinear distortion of acoustic devices for radio-frequency applications and its supression},
  author={Masanori Ueda and Masafumi Iwaki and Tokihiro Nishihara and Yoshio Satoh and Ken-ya Hashimoto},
  journal={2009 IEEE International Ultrasonics Symposium},
  year={2009},
  pages={876-879}
}
In this paper, we discuss the nonlinear performance difference between surface acoustic wave (SAW) and bulk acoustic wave (BAW) resonators, which are inter-modulation-distortion (IMD) and triple-beat (TB) products, and indicate the importance to reduce even-order nonlinearity of BAW resonator. Then, we were able to validate the accuracy and efficiency of our proposed simulation technique on BAW devices by comparing our simulation with experimental data. We verified that our circuit model is a… CONTINUE READING
Highly Cited
This paper has 18 citations. REVIEW CITATIONS
14 Citations
12 References
Similar Papers

Citations

Publications citing this paper.
Showing 1-10 of 14 extracted citations

References

Publications referenced by this paper.
Showing 1-10 of 12 references

Influence of Linear and Non-Linear Distortions in SAW/FBAR Duplexers on Third-Generation Mobile Phone Systems

  • J. Tsutsumi, S. Inoue, M. Ueda, R. Weigel
  • Proc. Of the European Micro Wave Association,
  • 2007
1 Excerpt

Development of Substrate Structures and Processes for Practical Applications of Various Surface Acoustic Wave Devices

  • M. Kadota
  • Jpn. J. Appl. Phys. Vol
  • 2005
1 Excerpt

Bulk-Acoustic-Wave Filters for Cell Phone Applications

  • R. Aigner
  • IEEE Int’l. Microwave Symp. Workshop Note & Short…
  • 2004
1 Excerpt

High - Frequency SAW Duplexer with LowLoss and Steep Cut - Off Characteristics ”

  • J. Tsutsumi, S. Inoue, Y. Iwamoto, Y. Satoh, M. Ueda, O. Ikata
  • IEEE Proc . Ultrason . Symp .
  • 2002

Ikata, “High-Frequency SAW Duplexer with Low-Loss and Steep Cut-Off Characteristics

  • T. Matsuda, J. Tsutsumi, S. Inoue, Y. Iwamoto, Y. Satoh, M. Ueda
  • IEEE Proc. Ultrason. Symp.,
  • 2002
1 Excerpt

Oshmyansky, “A 5 mm × 5 mm × 1.37 mm Hermetic FBAR Duplexer for PCS Handsets with Wafer-Scale Packaging

  • P. Bradley, R. Ruby, A. Barfknecht, F. Geefay, C. Han, G. Gan
  • IEEE Proc. Ultrason. Symp,
  • 2002
1 Excerpt

Similar Papers

Loading similar papers…