Investigation of negative bias temperature instability dependence on fin width of silicon-on-insulator-fin-based field effect transistors

@inproceedings{Young2015InvestigationON,
  title={Investigation of negative bias temperature instability dependence on fin width of silicon-on-insulator-fin-based field effect transistors},
  author={Chadwin D. Young and Arnost Neugroschel and Kausik Majumdar and Ken Matthews and Zhe Wang and Chris Hobbs},
  year={2015}
}

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