Investigation of gross die per wafer formulas
@article{Vries2005InvestigationOG,
title={Investigation of gross die per wafer formulas},
author={D. de Vries},
journal={IEEE Transactions on Semiconductor Manufacturing},
year={2005},
volume={18},
pages={136-139}
}Different forms of gross die per wafer formulas are investigated with respect to the accuracy in which they model the exact gross die per wafer count, as a function of die area and die aspect ratio. Coefficients are given with which the different formulas provide a sufficiently accurate model. To model the aspect ratio dependence, it is found that the mean of die width and die height should be used as a parameter.
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