Investigation of gross die per wafer formulas

  title={Investigation of gross die per wafer formulas},
  author={D. de Vries},
  journal={IEEE Transactions on Semiconductor Manufacturing},
  • D. de Vries
  • Published 2005
  • IEEE Transactions on Semiconductor Manufacturing
  • Different forms of gross die per wafer formulas are investigated with respect to the accuracy in which they model the exact gross die per wafer count, as a function of die area and die aspect ratio. Coefficients are given with which the different formulas provide a sufficiently accurate model. To model the aspect ratio dependence, it is found that the mean of die width and die height should be used as a parameter. 
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