Investigation of boundary migration during grain growth in fully recrystallised high purity nickel

@inproceedings{Zhang2010InvestigationOB,
  title={Investigation of boundary migration during grain growth in fully recrystallised high purity nickel},
  author={Yu Bin Zhang and Andrew Godfrey and Wei Liu and Quan-tao Liu},
  year={2010}
}
AbstractThe movement of individual boundaries during grain growth after primary recrystallisation in a 96% cold rolled sample of pure nickel has been followed using electron backscatter diffraction maps of the same surface area taken after each of several annealing steps. Particular attention is given to the migration of boundaries with near Σ3 misorientations. During annealing, a small reduction in the length fraction the Σ3 boundaries was observed in the early stages of annealing. Analysis of… CONTINUE READING

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