Investigation of Siloxane Film Formation on Functionalized Germanium Crystals by Atomic Force Microscopy and FTIR-ATR Spectroscopy

@inproceedings{Glowacky2013InvestigationOS,
  title={Investigation of Siloxane Film Formation on Functionalized Germanium Crystals by Atomic Force Microscopy and FTIR-ATR Spectroscopy},
  author={J. Glowacky and Stefan Heissler and Markus Boese and Harald Leiste and Tugba Koker and Werner Faubel and Axel Gerdes and Hiltrud S. Mueller},
  year={2013}
}
To understand the long-time behaviour of silanes used as surface protection for cement based materials, the formation and stability of different siloxane films formed on these compounds were investigated by atomic force microscopy (AFM). Kinetics of the silane reactions were characterized by FTIR-ATR spectroscopy using a functionalized Germanium crystal as… CONTINUE READING