Investigating charge trapping properties of combinations of XLPE and semiconductive materials in plaques and cable models

@article{Montanari2005InvestigatingCT,
  title={Investigating charge trapping properties of combinations of XLPE and semiconductive materials in plaques and cable models},
  author={G. C. Montanari and C Laurent and Gilbert Teyss{\`e}dre and F. Campus and U. H. Nilsson and P. Morshuis and L. A. Dissado},
  journal={Proceedings of 2005 International Symposium on Electrical Insulating Materials, 2005. (ISEIM 2005).},
  year={2005},
  volume={1},
  pages={99-102 Vol. 1}
}
The results of space charge observations performed on test objects having the purpose to investigate polymeric insulation/semiconductor interfaces under DC electrical field are presented in this paper. Combinations of different crosslinked semiconductor and polyethylene insulating materials, are considered. The test objects consist of plaques with extruded semiconductor and cable models, having inner and outer semiconductor. 

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The electrical degradation threshold of polyethylene investigated by space charge and conduction current measurements "

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