Interdiffusion in Composition Modulated Copper-nickel Thin Films

@inproceedings{Tsakalakos2016InterdiffusionIC,
  title={Interdiffusion in Composition Modulated Copper-nickel Thin Films},
  author={T. Tsakalakos and James I. Hilliard},
  year={2016}
}
Interdiffusivities were measured in vapor-deposited Cu-Ni foils containing [ I l l ] composition modulations with wavelengths between 0.8 and 5 nm. The interdiffusivities in the range of 375-450 O C , measured from the decay rate of X-ray diffraction satellite intensities, were in good agreement with an extrapolation of existing high temperature data… CONTINUE READING