Interactive overlay maps for US patent (USPTO) data based on International Patent Classification (IPC)

@article{Leydesdorff2012InteractiveOM,
  title={Interactive overlay maps for US patent (USPTO) data based on International Patent Classification (IPC)},
  author={Loet Leydesdorff and Duncan Kushnir and Ismael Rafols},
  journal={Scientometrics},
  year={2012},
  volume={98},
  pages={1583-1599}
}
We report on the development of an interface to the US Patent and Trademark Office (USPTO) that allows for the mapping of patent portfolios as overlays to basemaps constructed from citation relations among all patents contained in this database during the period 1976–2011. [] Key Result This instrument allows for addressing questions about technological distance, diversity in portfolios, and animating the developments of both technologies and technological capacities of organizations over time.
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Patent overlay mapping: Visualizing technological distance
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