Interaction forces between silica surfaces in cationic surfactant solutions: an atomic force microscopy study.

@article{Lderitz2013InteractionFB,
  title={Interaction forces between silica surfaces in cationic surfactant solutions: an atomic force microscopy study.},
  author={Liset A C L{\"u}deritz and Regine v Klitzing},
  journal={Journal of colloid and interface science},
  year={2013},
  volume={402},
  pages={19-26}
}
The interaction forces between silicon oxide surfaces in the presence of surfactant solutions were studied. Based on the qualitative and quantitative analysis of these interaction forces the correlation with the structure of the aggregates on the surfaces is analyzed. A colloidal probe atomic force microscope (AFM) was used to measure the forces between two colloidal silica particles and between a colloidal particle and a silicon wafer in the presence of hexadecyltrimethylammonium bromide (CTAB… CONTINUE READING