Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach

@article{Feige1998IntegrationOT,
  title={Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach},
  author={Chris Feige and Jan Ten Pierick and Clemens Wouters and Ronald J. W. T. Tangelder and Hans G. Kerkhoff},
  journal={Journal of Electronic Testing},
  year={1998},
  volume={14},
  pages={125-131}
}
In this paper a concept is proposed to combine a bus-transfer based test approach (AMBA) with the well-known scan-test technique. This novel approach combines the advantages of modularity and core reuse (AMBA) with the benefits of high fault coverages and short time-to-market cycles (scan). The consequences with respect to test hardware implementation and tool flow are discussed. 
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