Integration and test strategies for semiconductor manufacturing equipment 1

@inproceedings{Jong2006IntegrationAT,
  title={Integration and test strategies for semiconductor manufacturing equipment 1},
  author={Ivo S. M. de Jong and R. Boumen and J. M. van de Mortel-Fronczak and J. E. Rooda and J. M. v. d. Mortel},
  year={2006}
}
The complexity of semiconductor manufacturing equipment is growing. This growth results in a complexity increase of the integration and test phase of these systems. Simply adding more test resources is not possible anymore, because of the cost involved. A better design of an integration and test strategy can help to optimize this hectic phase. However… CONTINUE READING