Integrated quantum efficiency, topography, and stress metrology for solar cell manufacturing: real space approach

@inproceedings{Walecki2008IntegratedQE,
  title={Integrated quantum efficiency, topography, and stress metrology for solar cell manufacturing: real space approach},
  author={Wojciech J. Walecki and Fanny Szondy},
  booktitle={Optics + Photonics for Sustainable Energy},
  year={2008}
}
  • W. Walecki, F. Szondy
  • Published in
    Optics + Photonics for…
    10 September 2008
  • Chemistry, Engineering
We report a new system for measurement of the spatially resolved quantum efficiency (QE) of the semiconductor solarcells. In our method solar-cell is illuminated by modified liquid crystal display projector scanner. System allows to measure photo-current, and optical properties of the illuminated surface. The same system can be also used to measure surface topography of the wafer, its bow, and warp, and calculate lateral stress in the structure if structure cross-section is known. 
3 Citations
Integrated quantum efficiency, reflectance, topography and stress metrology for solar cell manufacturing
We report application of phase shifting interferometric measurements to study of the spatially resolved quantum efficiency (QE) of the semiconductor solar-cells. In our method solar-cell isExpand
Glazings and Coatings
Windows are key elements of a building as they play an important role in many of its functions: They allow the continuity of indoor/outdoor space by visible light admittance and present a shield fromExpand
Glazings and Coatings

References

SHOWING 1-10 OF 13 REFERENCES
Fast in-line surface topography metrology enabling stress calculation for solar cell manufacturing for throughput in excess of 2000 wafers per hour
We present a novel structured pattern projection tool for stress, and topography measurement of solar cells. The presented tool has expanded (two standard deviations) accuracy and repeatability ofExpand
CELLO: an advanced LBIC measurement technique for solar cell local characterization
An advanced light beam-induced current measurement for solar cell local characterization, called CELLO, has been developed and tested on mono- and multi-crystalline Si solar cells. A solar cell isExpand
Fast LBIC in-line characterization for process quality control in the photovoltaic industry
The photovoltaic industry asks for fast, non-destructive techniques for in-line characterization tools in solar cells production. We shall show in this paper that the use of the light beam inducedExpand
LBIC MEASUREMENTS ON LOW COST BACK CONTACT SOLAR CELLS
New crystalline silicon cell concepts like low cost back contact cells have a more complicated structure than appropriate for a simple device modelling. In order to increase the cell efficiency it isExpand
Overview of three-dimensional shape measurement using optical methods
TLDR
An overview of 3-D shape measurement using various optical methods, and a focus on structured light tech- niques where various optical configurations, image acquisition technology, data postprocessing and analysis methods and advantages and limitations are presented. Expand
Efficient calibration algorithm, and calibration pattern for correcting distortions for three-dimensional image acquisition systems for microscopic applications
TLDR
A novel method for fully automated detection of calibration features which reduces computation effort when compared to traditional corner, edge, and conic detection algorithms and suggests new modified algorithm which produces unique solution. Expand
Review of 20 years of range sensor development
  • F. Blais
  • Computer Science
  • J. Electronic Imaging
  • 2004
TLDR
An overview of 3-D digitizing techniques is presented with an emphasis on commercial techniques and systems currently available, with a focus on commercial systems that are considered good representations of the key technologies that have survived the test of years. Expand
Conference proceedings
Copyright and Reprint Permissions: Abstracting is permitted with credit to the source. Libraries are permitted to photocopy beyond the limits of U.S. copyright law for private use of patrons thoseExpand
G
  • Agostinelli, “Fast LBIC in-line characterization for process quality control in the photovoltaic industry” Solar Energy Materials & Solar Cells 72
  • 2002
and H
  • Föll, “CELLO: an advanced LBIC measurement technique for solar cell local characterization” Solar Energy Materials & Solar Cells 76
  • 2003
...
1
2
...