Integrated circuit authentication using photon-limited x-ray microscopy.

Abstract

A counterfeit integrated circuit (IC) may contain subtle changes to its circuit configuration. These changes may be observed when imaged using an x-ray; however, the energy from the x-ray can potentially damage the IC. We have investigated a technique to authenticate ICs under photon-limited x-ray imaging. We modeled an x-ray image with lower energy by… (More)
DOI: 10.1364/OL.41.003297

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Cite this paper

@article{Markman2016IntegratedCA, title={Integrated circuit authentication using photon-limited x-ray microscopy.}, author={Adam S. Markman and Bahram Javidi}, journal={Optics letters}, year={2016}, volume={41 14}, pages={3297-300} }