Instrument for in situ hard x-ray nanobeam characterization during epitaxial crystallization and materials transformations.

@article{Marks2021InstrumentFI,
  title={Instrument for in situ hard x-ray nanobeam characterization during epitaxial crystallization and materials transformations.},
  author={Samuel D Marks and Peiyu Quan and Rui Liu and Matthew J Highland and Hua Zhou and Thomas F Kuech and G. Brian Stephenson and Paul G. Evans},
  journal={The Review of scientific instruments},
  year={2021},
  volume={92 2},
  pages={
          023908
        }
}
Solid-phase epitaxy (SPE) and other three-dimensional epitaxial crystallization processes pose challenging structural and chemical characterization problems. The concentration of defects, the spatial distribution of elastic strain, and the chemical state of ions each vary with nanoscale characteristic length scales and depend sensitively on the gas environment and elastic boundary conditions during growth. The lateral or three-dimensional propagation of crystalline interfaces in SPE has… Expand
1 Citations
Synchrotron studies of functional interfaces and the state of the art: A perspective
TLDR
A variety of current scattering and spectroscopic techniques are described with an eye toward how these will evolve, particularly with the advent of diffraction-limited sources. Expand

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