Instability Induced by Ultraviolet Light in ZnO Thin-Film Transistors

Abstract

We investigate the electrical properties of ZnO thin-film transistors (TFTs) under the ultraviolet (UV) light illumination to clarify the device reliability. The ON/OFF current ratio of ZnO TFTs shows an evident reduction due to the creation of UV photo-induced current. This behavior degradation becomes severe for devices exposed to a short-wavelength UV… (More)

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