Inquisitive Defect Cache: A Means of Combating Manufacturing Induced Process Variation

@article{Sasan2011InquisitiveDC,
  title={Inquisitive Defect Cache: A Means of Combating Manufacturing Induced Process Variation},
  author={Avesta Sasan and Houman Homayoun and Ahmed M. Eltawil and Fadi J. Kurdahi},
  journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
  year={2011},
  volume={19},
  pages={1597-1609}
}
This paper proposes a new fault tolerant cache organization capable of dynamically mapping the in-use defective locations in a processor cache to an auxiliary parallel memory, creating a defect-free view of the cache for the processor. While voltage scaling has a super-linear effect on reducing power, it exponentially increases the defect rate in memory. The ability of the proposed cache organization to tolerate a large number of defects makes it a perfect candidate for voltage-scalable… CONTINUE READING
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