Injected charge from surface traps into films with deep bulk traps

Abstract

In many cases the profile of an open circuit TSC in Teflon FEP shows two well defined peaks. The first is usually interpreted as due to charge injection from thermally activated surface traps into bulk traps and the second one, occurring at higher temperatures, as charge emission from these volume traps. Extending a calculation done by Kanazawa and Batra [1… (More)

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