Infrared characterization of SrTiO/sub 3/ thin films using attenuated total reflectance


Attenuated Total Reflectance was used to measure the phonon vibration frequencies over the range 425-800 cm/sup -1/ of SrTiO/sub 3/ thin films deposited either directly on LaAlO/sub 3/, or on YBCO-coated LaAlO/sub 3/ single crystal substrates. In the s-polarized spectra, the transverse optic Ti-O stretching vibration shifted to lower frequencies as the film… (More)

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