Infrared Ray Emission (IREM) Based Post-Silicon Power Debug Flows Developed for Chip Power Performance

@article{Chen2006InfraredRE,
  title={Infrared Ray Emission (IREM) Based Post-Silicon Power Debug Flows Developed for Chip Power Performance},
  author={Y.-C.S. Chen and Daniel Lu and Dan Bockelman and Manzoor Ma and Islam Wan},
  journal={2006 IEEE International Reliability Physics Symposium Proceedings},
  year={2006},
  pages={639-640}
}
Pre-silicon power modeling, post-silicon power validation, and power debugs design efforts have significantly increased to meet speed performance, reliability deliverables and design robustness for manufacturing. IREM based power debug flow has been developed to isolate marginal circuits with excessive static and dynamic power consumption. Three root cause analysis cases are presented to demonstrate the success of this novel post-silicon debug flow 

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