Influence of interface effect on the ferroelectric and ferromagnetic properties of CFO/PMNT multilayered thin films

Abstract

The CoFe<inf>2</inf>O<inf>4</inf>/Pb(Mg<inf>1/3</inf>Nb<inf>2/3</inf>)O<inf>3</inf>-PbTiO<inf>3</inf> (CFO/PMNT) multilayer thin films have been prepared on LaNiO<inf>3</inf>/SiO<inf>2</inf>/Si(100) substrate using radio frequency magnetron sputtering method. The smooth, dense and crack-free surface of CFO/PMNT multilayer thin film shows the excellent crystal quality with root-mean-square (RMS) roughness only 2.9nm. The influence of the interface effect, film thickness, period number n and crystallite orientation of CFO/PMNT multilayer thin films on their ferroelectric and ferromagnetic properties were investigated. The related mechanism was also discussed.

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Cite this paper

@article{Zhu2011InfluenceOI, title={Influence of interface effect on the ferroelectric and ferromagnetic properties of CFO/PMNT multilayered thin films}, author={Jianguo Zhu and Xiaolong Chen and Hongli Guo and Dongxu Yan and Hong Liu and Dingquan Xiao}, journal={2011 International Symposium on Applications of Ferroelectrics (ISAF/PFM) and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials}, year={2011}, pages={1-3} }