Influence of Radiation Diffraction upon Metrological Parameters of the Ir Line Scanner

@inproceedings{Rozanski2009InfluenceOR,
  title={Influence of Radiation Diffraction upon Metrological Parameters of the Ir Line Scanner},
  author={Leszek Rozanski and Stanislaw Poloszyk},
  year={2009}
}
− The influence of IR radiation diffraction upon geometrical resolution of the IR line scanner has been analysed in the paper. Analysis of IR line scanner properties in band 3 – 5 μm and 8 – 12 μm proved that when applying the aperture diaphragms the influence of the radiant diffraction upon geometrical resolution may be significant. This influence is… CONTINUE READING