Influence and model of gate oxide breakdown on CMOS inverters

@article{Rodrguez2003InfluenceAM,
  title={Influence and model of gate oxide breakdown on CMOS inverters},
  author={Rosana Rodr{\'i}guez and James H. Stathis and Barry P. Linder and Rajiv V. Joshi and Ching-Te Chuang},
  journal={Microelectronics Reliability},
  year={2003},
  volume={43},
  pages={1439-1444}
}
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